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"Experimental investigation of the dielectric-semiconductor interface with ..."

J. Yang et al. (2005)

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DOI: 10.1016/J.MICROREL.2004.11.030

access: closed

type: Journal Article

metadata version: 2020-02-22

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J. Yang, Joseph J. Kopanski, Adam Postula, Marek E. Bialkowski:
Experimental investigation of the dielectric-semiconductor interface with scanning capacitance microscopy. Microelectron. Reliab. 45(5-6): 887-890 (2005)

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