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"Degradation of InGaN blue light-emitting diodes under continuous and ..."

Takeshi Yanagisawa, Takeshi Kojima (2003)

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DOI: 10.1016/S0026-2714(03)00093-3

access: closed

type: Journal Article

metadata version: 2020-02-22

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  - https://dblp.org/rec/journals/mr/YanagisawaK03a
Takeshi Yanagisawa, Takeshi Kojima:
Degradation of InGaN blue light-emitting diodes under continuous and low-speed pulse operations. Microelectron. Reliab. 43(6): 977-980 (2003)

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