default search action

combined dblp search
author search
venue search
publication search

ask others

"A fusion prognostics-based qualification test methodology for ..."

Michael G. Pecht et al. (2016)

> Home

Details and statistics

DOI: 10.1016/J.MICROREL.2016.04.002

access: closed

type: Journal Article

metadata version: 2022-10-02

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/mr/PechtSKHC16
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mr/PechtSKHC16
Michael G. Pecht, Tadahiro Shibutani, Myeongsu Kang, Melinda Hodkiewicz, Edward Cripps:
A fusion prognostics-based qualification test methodology for microelectronic products. Microelectron. Reliab. 63: 320-324 (2016)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.