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"Influence of test structure design on stress-induced-voiding using an ..."

Melina Lofrano et al. (2011)

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DOI: 10.1016/J.MICROREL.2011.07.068

access: closed

type: Journal Article

metadata version: 2020-02-22

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Melina Lofrano, Kris Croes, Ingrid De Wolf, Christopher J. Wilson:
Influence of test structure design on stress-induced-voiding using an experimentally validated Finite Element Modeling approach. Microelectron. Reliab. 51(9-11): 1578-1581 (2011)

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