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"Detection of localized UIS failure on IGBTs with the aid of lock-in ..."

Giovanni Breglio et al. (2008)

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DOI: 10.1016/J.MICROREL.2008.06.042

access: closed

type: Journal Article

metadata version: 2024-08-28

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Giovanni Breglio, Andrea Irace, Ettore Napoli, Michele Riccio, Paolo Spirito, Kimimori Hamada, T. Nishijima, T. Ueta:
Detection of localized UIS failure on IGBTs with the aid of lock-in thermography. Microelectron. Reliab. 48(8-9): 1432-1434 (2008)

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