default search action

combined dblp search
author search
venue search
publication search

ask others

"Study of a failure mechanism during UIS switching of planar PT-IGBT with ..."

Giovanni Breglio et al. (2007)

> Home

Details and statistics

DOI: 10.1016/J.MICROREL.2007.07.009

access: closed

type: Journal Article

metadata version: 2024-08-28

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/mr/BreglioINSHNU07
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mr/BreglioINSHNU07
Giovanni Breglio, Andrea Irace, Ettore Napoli, Paolo Spirito, Kimimori Hamada, T. Nishijima, T. Ueta:
Study of a failure mechanism during UIS switching of planar PT-IGBT with current sense cell. Microelectron. Reliab. 47(9-11): 1756-1760 (2007)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.