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"Reliability analysis of power MOSFET's with the help of compact models and ..."

Alberto Castellazzi et al. (2002)

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DOI: 10.1016/S0026-2714(02)00198-1

access: closed

type: Journal Article

metadata version: 2024-10-06

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Alberto Castellazzi, R. Kraus, Norbert Seliger, Doris Schmitt-Landsiedel:
Reliability analysis of power MOSFET's with the help of compact models and circuit simulation. Microelectron. Reliab. 42(9-11): 1605-1610 (2002)

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