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"Optimal layout and work allocation in batch assembly under learning effect."

Yuval Cohen et al. (2008)

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DOI: 10.1504/IJISTA.2008.016366

access: closed

type: Journal Article

metadata version: 2020-07-09

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  - journals/ijista/CohenDVS08a
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  - https://dblp.org/rec/journals/ijista/CohenDVS08a
Yuval Cohen, Ezey M. Dar-El, Gad Vitner, Subhash C. Sarin:
Optimal layout and work allocation in batch assembly under learning effect. Int. J. Intell. Syst. Technol. Appl. 4(1/2): 188-207 (2008)

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