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"Insulator Defect Recognition Based on Vision Big-Model Transfer Learning ..."

Siyuan Liu et al. (2024)

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DOI: 10.1049/2024/4182652

access: closed

type: Journal Article

metadata version: 2024-08-02

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  - https://dblp.org/rec/journals/iet-spr/LiuMZPL24
Siyuan Liu, Yihua Ma, Zedong Zheng, Xinfu Pang, Bingyou Li:
Insulator Defect Recognition Based on Vision Big-Model Transfer Learning and Stochastic Configuration Network. IET Signal Process. 2024 (2024)

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