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"A Test-Pattern-Generation Algorithm for Sequential Circuits."

Elisabeth Auth, Michael H. Schulz (1991)

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DOI: 10.1109/54.82040

access: closed

type: Journal Article

metadata version: 2020-05-17

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  dblp key:
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  - https://dblp.org/rec/journals/dt/AuthS91
Elisabeth Auth, Michael H. Schulz:
A Test-Pattern-Generation Algorithm for Sequential Circuits. IEEE Des. Test Comput. 8(2): 72-86 (1991)

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