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"Multiple Scan Chain Design for Two-Pattern Testing."

Ilia Polian, Bernd Becker (2001)

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DOI: —

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type: Conference or Workshop Paper

metadata version: 2023-07-25

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  dblp key:
  - conf/latw/Polian001
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  - https://dblp.org/rec/conf/latw/Polian001
Ilia Polian, Bernd Becker:
Multiple Scan Chain Design for Two-Pattern Testing. LATW 2001: 156-161

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