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"A Semi-analytical Model for Interconnect Open Defects in FinFET Logic Cells."

Freddy Forero et al. (2019)

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DOI: 10.1109/LATW.2019.8704612

access: closed

type: Conference or Workshop Paper

metadata version: 2024-04-19

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  dblp key:
  - conf/latw/ForeroGRC19
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Freddy Forero, Jean-Marc Gallière, Michel Renovell, Víctor H. Champac:
A Semi-analytical Model for Interconnect Open Defects in FinFET Logic Cells. LATS 2019: 1-6

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