default search action

combined dblp search
author search
venue search
publication search

ask others

"A Comparative Study Between FinFET and CMOS-Based SRAMs under Resistive ..."

Thiago Santos Copetti et al. (2019)

> Home

Details and statistics

DOI: 10.1109/LATW.2019.8704579

access: closed

type: Conference or Workshop Paper

metadata version: 2019-05-07

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/latw/CopettiBBAP19
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/latw/CopettiBBAP19
Thiago Santos Copetti, Tiago R. Balen, E. Brum, C. Aquistapace, Leticia Bolzani Poehls:
A Comparative Study Between FinFET and CMOS-Based SRAMs under Resistive Defects. LATS 2019: 1-6

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.