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"Classifying Bad Chips and Ordering Test Sets."

François-Fabien Ferhani, Edward J. McCluskey (2006)

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DOI: 10.1109/TEST.2006.297736

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-24

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  dblp key:
  - conf/itc/FerhaniM06
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  - https://dblp.org/rec/conf/itc/FerhaniM06
François-Fabien Ferhani, Edward J. McCluskey:
Classifying Bad Chips and Ordering Test Sets. ITC 2006: 1-10

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