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"High Fault Coverage of In-Circuit IC Pin Faults with a Vectorless Test ..."

Jack Ferguson (1996)

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DOI: 10.1109/TEST.1996.557156

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Jack Ferguson:
High Fault Coverage of In-Circuit IC Pin Faults with a Vectorless Test Technique Using Parasitic Transistors. ITC 1996: 926

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