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"RF test accuracy and capacity enhancement on ATE for silicon TV tuners."

Y. Fan et al. (2016)

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DOI: 10.1109/TEST.2016.7805842

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-24

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  dblp key:
  - conf/itc/FanVSRJDK16
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  - https://dblp.org/rec/conf/itc/FanVSRJDK16
Y. Fan, A. Verma, Y. Su, L. Rose, J. Janney, V. Do, S. Kumar:
RF test accuracy and capacity enhancement on ATE for silicon TV tuners. ITC 2016: 1-10

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