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"12Gbps SerDes Jitter Tolerance BIST in production loopback testing with ..."

Yi Cai et al. (2013)

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DOI: 10.1109/TEST.2013.6651882

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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  dblp key:
  - conf/itc/CaiFCOR13
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  persistent URL:
  - https://dblp.org/rec/conf/itc/CaiFCOR13
Yi Cai, Liming Fang, Ivan Chan, Max Olsen, Kevin Richter:
12Gbps SerDes Jitter Tolerance BIST in production loopback testing with enhanced spread spectrum clock generation circuit. ITC 2013: 1-8

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