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"Susceptibility of planar and 3D tri-gate technologies to muon-induced ..."

Norbert Seifert et al. (2015)

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DOI: 10.1109/IRPS.2015.7112676

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-21

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Norbert Seifert, Shah M. Jahinuzzaman, Jyothi Velamala, Nikunj Patel:
Susceptibility of planar and 3D tri-gate technologies to muon-induced single event upsets. IRPS 2015: 2

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