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"Connecting Software Reliability Growth Models to Software Defect Tracking."

Maskura Nafreen et al. (2020)

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DOI: 10.1109/ISSRE5003.2020.00022

access: closed

type: Conference or Workshop Paper

metadata version: 2020-11-17

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  dblp key:
  - conf/issre/NafreenLFNSW20
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  - https://dblp.org/rec/conf/issre/NafreenLFNSW20
Maskura Nafreen, Melanie Luperon, Lance Fiondella, Vidhyashree Nagaraju, Ying Shi, Thierry Wandji:
Connecting Software Reliability Growth Models to Software Defect Tracking. ISSRE 2020: 138-147

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