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"Treatment of Ventricular Assist Device Test Bench Data for Prediction of ..."

Jeferson C. Dias et al. (2019)

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DOI: 10.1007/978-3-030-17771-3_15

access: closed

type: Conference or Workshop Paper

metadata version: 2021-04-09

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  dblp key:
  - conf/ifip5-5/DiasDLSJMMMF19
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  - https://dblp.org/rec/conf/ifip5-5/DiasDLSJMMMF19
Jeferson C. Dias, Jônatas C. Dias, Edinei P. Legaspe, Rodrigo Lima Stoeterau, Fabrício Junqueira, Newton Maruyama, Lucas Antônio Moscato, Paulo E. Miyagi, Diolino J. Santos Filho:
Treatment of Ventricular Assist Device Test Bench Data for Prediction of Failures and Improved Intrinsic Reliability. DoCEIS 2019: 183-190

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