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"Lifetime reliability assessment with aging information from low-level sensors."

Yao Wang, Sorin Dan Cotofana, Liang Fang (2013)

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DOI: 10.1145/2483028.2483132

access: closed

type: Conference or Workshop Paper

metadata version: 2020-06-15

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  - conf/glvlsi/WangCF13
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Yao Wang, Sorin Dan Cotofana, Liang Fang:
Lifetime reliability assessment with aging information from low-level sensors. ACM Great Lakes Symposium on VLSI 2013: 339-340

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