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"Estimating MLC NAND flash endurance: a genetic programming based symbolic ..."

Damien Hogan, Tom Arbuckle, Conor Ryan (2013)

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DOI: 10.1145/2463372.2463537

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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Damien Hogan, Tom Arbuckle, Conor Ryan:
Estimating MLC NAND flash endurance: a genetic programming based symbolic regression application. GECCO 2013: 1285-1292

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