default search action

combined dblp search
author search
venue search
publication search

ask others

"Design and analysis of test schemes for algorithm-based fault tolerance."

Dechang Gu, Daniel J. Rosenkrantz, S. S. Ravi (1990)

> Home

Details and statistics

DOI: 10.1109/FTCS.1990.89341

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-23

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/ftcs/GuRR90
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/ftcs/GuRR90
Dechang Gu, Daniel J. Rosenkrantz, S. S. Ravi:
Design and analysis of test schemes for algorithm-based fault tolerance. FTCS 1990: 106-113

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.