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"Modeling of dynamic trap density increase for aging simulation of any ..."

Mitiko Miura-Mattausch et al. (2017)

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DOI: 10.1109/ESSDERC.2017.8066624

access: closed

type: Conference or Workshop Paper

metadata version: 2019-07-03

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  - conf/essderc/Miura-Mattausch17
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  - https://dblp.org/rec/conf/essderc/Miura-Mattausch17
Mitiko Miura-Mattausch, Hidenori Miyamoto, Hideyuki Kikuchihara, Dondee Navarro, Tapas K. Maiti, Nezam Rohbani, C. Ma, Hans Jürgen Mattausch, A. Schiffmann, Alexander Steinmair, Ehrenfried Seebacher:
Modeling of dynamic trap density increase for aging simulation of any MOSFET circuits. ESSDERC 2017: 192-195

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