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"SEN: A Novel Feature Normalization Dissimilarity Measure for Prototypical ..."

Van Nhan Nguyen et al. (2020)

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DOI: 10.1007/978-3-030-58592-1_8

access: closed

type: Conference or Workshop Paper

metadata version: 2020-12-29

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  dblp key:
  - conf/eccv/NguyenLWKRJ20
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  - https://dblp.org/rec/conf/eccv/NguyenLWKRJ20
Van Nhan Nguyen, Sigurd Løkse, Kristoffer Wickstrøm, Michael Kampffmeyer, Davide Roverso, Robert Jenssen:
SEN: A Novel Feature Normalization Dissimilarity Measure for Prototypical Few-Shot Learning Networks. ECCV (23) 2020: 118-134

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