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"SAT-based ATPG testing of inter- and intra-gate bridging faults."

Toru Nakura et al. (2009)

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DOI: 10.1109/ECCTD.2009.5275065

access: closed

type: Conference or Workshop Paper

metadata version: 2020-12-29

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  - conf/ecctd/NakuraTFIKA09
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  - https://dblp.org/rec/conf/ecctd/NakuraTFIKA09
Toru Nakura, Yutaro Tatemura, Görschwin Fey, Makoto Ikeda, Satoshi Komatsu, Kunihiro Asada:
SAT-based ATPG testing of inter- and intra-gate bridging faults. ECCTD 2009: 643-646

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