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"Power and Thermal Fault Effect Exploration Framework for Reader/Smart Card ..."
Norbert Druml et al. (2013)
- Norbert Druml, Manuel Menghin, Tobias Rauter, Christian Steger, Reinhold Weiss, Christian Bachmann, Holger Bock, Josef Haid:
Power and Thermal Fault Effect Exploration Framework for Reader/Smart Card Designs. DSD 2013: 898-906
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