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"Improving Cell-Aware Test for Intra-Cell Short Defects."

Dong-Zhen Lee et al. (2022)

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DOI: 10.23919/DATE54114.2022.9774502

access: closed

type: Conference or Workshop Paper

metadata version: 2022-05-25

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  dblp key:
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Dong-Zhen Lee, Ying-Yen Chen, Kai-Chiang Wu, Mango C.-T. Chao:
Improving Cell-Aware Test for Intra-Cell Short Defects. DATE 2022: 436-441

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