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"Efficient Cell-Aware Fault Modeling by Switch-Level Test Generation."

Harry H. Chen et al. (2016)

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DOI: 10.1109/ATS.2016.33

access: closed

type: Conference or Workshop Paper

metadata version: 2024-10-06

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  dblp key:
  - conf/ats/ChenCCW16
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  persistent URL:
  - https://dblp.org/rec/conf/ats/ChenCCW16
Harry H. Chen, Simon Y.-H. Chen, Po-Yao Chuang, Cheng-Wen Wu:
Efficient Cell-Aware Fault Modeling by Switch-Level Test Generation. ATS 2016: 197-202

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