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"A SMT-based diagnostic test generation method for combinational circuits."

Sarvesh Prabhu et al. (2012)

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DOI: 10.1109/VTS.2012.6231105

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-25

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  dblp key:
  - conf/vts/PrabhuHLG12
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  - https://dblp.org/rec/conf/vts/PrabhuHLG12
Sarvesh Prabhu, Michael S. Hsiao, Loganathan Lingappan, Vijay Gangaram:
A SMT-based diagnostic test generation method for combinational circuits. VTS 2012: 215-220

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