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Thomas Polzer
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2020 – today
- 2023
- [c17]Fabian Steiner, Bernhard Lueger, Bernhard Wallisch, Thomas Polzer:
Automated Evaluation System for Microcontroller Assignments. EDUCON 2023: 1-7
2010 – 2019
- 2019
- [j5]Thomas Polzer, Florian Huemer, Andreas Steininger:
An Experimental Study of Metastability-Induced Glitching Behavior. J. Circuits Syst. Comput. 28(Supplement-1): 1940006:1-1940006:21 (2019) - 2018
- [j4]Thomas Polzer, Florian Huemer, Andreas Steininger:
Refined metastability characterization using a time-to-digital converter. Microelectron. Reliab. 80: 91-99 (2018) - [c16]Florian Huemer, Thomas Polzer, Andreas Steininger:
Using a Duplex Time-to-Digital Converter for Metastability Characterization of an FPGA. DDECS 2018: 141-146 - 2017
- [j3]Thomas Polzer, Andreas Steininger:
A Model for the Metastability Delay of Sequential Elements. J. Circuits Syst. Comput. 26(8): 1740010:1-1740010:22 (2017) - [c15]Robert Najvirt, Thomas Polzer, Andreas Steininger:
Measuring Metastability with Free-Running Clocks. ASYNC 2017: 18-24 - [c14]Matthias Függer, Attila Kinali, Christoph Lenzen, Thomas Polzer:
Metastability-Aware Memory-Efficient Time-to-Digital Converters. ASYNC 2017: 49-56 - [c13]Thomas Polzer, Florian Huemer, Andreas Steininger:
Measuring metastability using a time-to-digital converter. DDECS 2017: 116-121 - 2016
- [j2]Thomas Polzer, Robert Najvirt, Florian Beck, Andreas Steininger:
On the Appropriate Handling of Metastable Voltages in FPGAs. J. Circuits Syst. Comput. 25(3): 1640020:1-1640020:25 (2016) - [c12]Thomas Polzer, Andreas Steininger:
A general approach for comparing metastable behavior of digital CMOS gates. DDECS 2016: 56-61 - 2015
- [c11]Robert Najvirt, Thomas Polzer, Florian Beck, Andreas Steininger:
Containment of Metastable Voltages in FPGAs. DDECS 2015: 197-202 - [c10]Thomas Polzer, Andreas Steininger:
Measuring the Distribution of Metastable Upsets over Time. DSD 2015: 189-196 - [c9]Thomas Polzer, Andreas Steininger:
Enhanced Metastability Characterization Based on AC Analysis. DSD 2015: 722-729 - 2013
- [j1]Varadan Savulimedu Veeravalli, Thomas Polzer, Ulrich Schmid, Andreas Steininger, Michael Hofbauer, Kurt Schweiger, Horst Dietrich, Kerstin Schneider-Hornstein, Horst Zimmermann, Kay-Obbe Voss, Bruno Merk, Michael Hajek:
An infrastructure for accurate characterization of single-event transients in digital circuits. Microprocess. Microsystems 37(8-A): 772-791 (2013) - [c8]Thomas Polzer, Andreas Steininger:
An Approach for Efficient Metastability Characterization of FPGAs through the Designer. ASYNC 2013: 174-182 - [c7]Thomas Polzer, Andreas Steininger:
Digital Late-Transition Metastability Simulation Model. DSD 2013: 121-128 - [c6]Thomas Polzer, Andreas Steininger:
SET propagation in micropipelines. PATMOS 2013: 126-133 - [c5]Thomas Polzer, Andreas Steininger:
Metastability characterization for muller C-elements. PATMOS 2013: 164-171 - 2012
- [c4]Jakob Lechner, Martin Lampacher, Thomas Polzer:
A Robust Asynchronous Interfacing Scheme with Four-Phase Dual-Rail Coding. ACSD 2012: 122-131 - [c3]Varadan Savulimedu Veeravalli, Thomas Polzer, Andreas Steininger, Ulrich Schmid:
Architecture and Design Analysis of a Digital Single-Event Transient/Upset Measurement Chip. DSD 2012: 8-17 - [c2]Thomas Polzer, Andreas Steininger, Jakob Lechner:
Muller C-Element Metastability Containment. PATMOS 2012: 103-112
2000 – 2009
- 2009
- [c1]Thomas Polzer, Thomas Handl, Andreas Steininger:
A Metastability-Free Multi-synchronous Communication Scheme for SoCs. SSS 2009: 578-592
Coauthor Index
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