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Najmi T. Jarwala
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Journal Articles
- 1997
- [j4]Najmi T. Jarwala:
Designing "Dual Personality" IEEE 1149.1 Compliant Multi-Chip Modules. J. Electron. Test. 10(1-2): 77-86 (1997) - 1996
- [j3]Bernd Könemann, Ben Bennetts, Najmi T. Jarwala, Benoit Nadeau-Dostie:
Built-In Self-Test: Assuring System Integrity. Computer 29(11): 39-45 (1996) - 1993
- [j2]Najmi T. Jarwala, Chi W. Yau:
A structured approach to board-level BIST using the boundary-scan master. Microprocess. Microsystems 17(5): 289-297 (1993) - 1988
- [j1]Najmi T. Jarwala, Dhiraj K. Pradhan:
TRAM: A Design Methodology for High-Performance, Easily Testable, Multimegabit RAM's. IEEE Trans. Computers 37(10): 1235-1250 (1988)
Conference and Workshop Papers
- 1996
- [c9]Najmi T. Jarwala, Paul W. Rutkowski, Shianling Wu, Chi W. Yau:
Lessons Learned from Practical Applications of BIST/B-S Technology. Asian Test Symposium 1996: 251-257 - [c8]J. El-Ziq, Najmi T. Jarwala, Niraj K. Jha, Peter Marwedel, Christos A. Papachristou, Janusz Rajski, John W. Sheppard:
Hardware-Software Co-Design for Test: It's the Last Straw! VTS 1996: 506-507 - 1995
- [c7]Wuudiann Ke, Duy Le, Najmi T. Jarwala:
A Secure Data Transmission Scheme for 1149.1 Backplane Test Bus. ITC 1995: 789-796 - 1994
- [c6]Najmi T. Jarwala:
Designing "Dual-Personality" IEEE 1149.1-Compliant Multi-Chip Modules. ITC 1994: 446-455 - 1992
- [c5]Najmi T. Jarwala, Paul Stiling, Enn Tammaru, Chi W. Yau:
A Framework for Boundary-Scan Based System Test Diagnosis. ITC 1992: 993-998 - 1991
- [c4]Najmi T. Jarwala, Chi W. Yau:
Achieving Board-Level BIST Using the Boundary-Scan Master. ITC 1991: 649-658 - 1990
- [c3]Chi W. Yau, Najmi T. Jarwala:
The boundary-scan master: target applications and functional requirements. ITC 1990: 311-315 - 1989
- [c2]Najmi T. Jarwala, Chi W. Yau:
A New Framework for Analyzing Test Generation and Diagnosis Algorithms for Wiring Interconnects. ITC 1989: 63-70 - [c1]Najmi T. Jarwala, Chi W. Yau:
A Unified Theory for Designing Optimal Test Generation and Diagnosis Algorithms for Board Interconnects. ITC 1989: 71-77
Coauthor Index
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