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Nitin Parimi

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2000 – 2009

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2007
[c2]
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  - conf/ats/Chakravadhanula07
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  - https://dblp.org/rec/conf/ats/Chakravadhanula07
Krishna Chakravadhanula, Nitin Parimi, Brian Foutz, Bing Li, Vivek Chickermane:
Low Power Reduced Pin Count Test Methodology. ATS 2007: 251-258
2004
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Nitin Parimi, Xiaoling Sun:
Toggle-Masking for Test-per-Scan VLSI Circuits. DFT 2004: 332-338

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