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Anthony J. Walton
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2010 – 2019
- 2018
- [j7]Damion K. Corrigan
, Vincent Vezza, Holger Schulze
A Microelectrode Array with Reproducible Performance Shows Loss of Consistency Following Functionalization with a Self-Assembled 6-Mercapto-1-hexanol Layer. Sensors 18(6): 1891 (2018) - 2017
- [c11]C. M. Mackenzie Dover, Yifan Li
Polydimethylsiloxane (PDMS)-based microfluidic channel with integrated commercial pressure sensors. IEEE SENSORS 2017: 1-3 - [c10]Chandrasekaran Gunasekaran, Ian Underwood
CMOS current attenuator for electrochemical sensing applications. IEEE SENSORS 2017: 1-3 - [c9]Hannah J. Levene, Ilka Schmueser, Ewen O. Blair
Investigating the durability of electrochemical sensors for molten salts. IEEE SENSORS 2017: 1-3 - 2014
- [j6]Giuseppe Schiavone
Integrated Magnetic MEMS Relays: Status of the Technology. Micromachines 5(3): 622-653 (2014) - 2010
- [j5]Mizanur R. Khondoker
Multi-Factorial Analysis of Class Prediction Error: Estimating Optimal Number of Biomarkers for Various Classification Rules. J. Bioinform. Comput. Biol. 8(6): 945-965 (2010)
2000 – 2009
- 2008
- [c8]Nakul Haridas, Ahmet T. Erdogan
Reconfigurable MEMS Antennas. AHS 2008: 147-154 - [e1]William Redman-White, Anthony J. Walton:
ESSCIRC 2008 - 34th European Solid-State Circuits Conference, Edinburgh, Scotland, UK, 15-19 September 2008. IEEE 2008, ISBN 978-1-4244-2361-3 [contents] - 2006
- [c7]Tughrul Arslan, Nakul Haridas, Erfu Yang
ESPACENET: A Framework of Evolvable and Reconfigurable Sensor Networks for Aerospace-Based Monitoring and Diagnostics. AHS 2006: 323-329 - 2004
- [j4]Yongmin Lee, J. Gourlay, W. J. Hossack, Ian Underwood, Anthony J. Walton:
Modelling of binary phase modulation in surface stabilized ferroelectric liquid crystal spatial light modulators. Microelectron. J. 35(2): 193-201 (2004) - 2003
- [j3]Alton B. Horsfall, Joyce M. M. dos Santos, S. M. Soare, Nicholas G. Wright
Direct measurement of residual stress in integrated circuit interconnect features. Microelectron. Reliab. 43(9-11): 1797-1801 (2003)
1990 – 1999
- 1999
- [j2]Gerard A. Allan, Anthony J. Walton:
Efficient extra material critical area algorithms. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 18(10): 1480-1486 (1999) - 1997
- [c6]Gerard A. Allan, Anthony J. Walton:
Efficient critical area estimation for arbitrary defect shapes. DFT 1997: 20-28 - 1996
- [c5]Gerard A. Allan, Anthony J. Walton:
Yield Prediction by Sampling with the EYES Tool. DFT 1996: 39-47 - [c4]Thomas G. Waring, Gerard A. Allan, Anthony J. Walton:
Integration of DFM Techniques and Design Automation. DFT 1996: 59-67 - 1995
- [c3]Gerard A. Allan, Anthony J. Walton:
Hierarchical critical area extraction with the EYE tool. DFT 1995: 28-36 - [c2]Gerard A. Allan, Anthony J. Walton:
Critical area extraction of extra material soft faults. DFT 1995: 55-62 - 1994
- [c1]Gerard A. Allan, Anthony J. Walton:
Efficient Critical Area Algorithms and Their Application to Yield Improvement and Test Strategies. DFT 1994: 88-96 - 1992
- [j1]Gerard A. Allan, Anthony J. Walton, Robert J. Holwill:
A yield improvement technique for IC layout using local design rules. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 11(11): 1355-1362 (1992)
Coauthor Index
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