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Gianluca Galzerano
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2020 – today
- 2023
- [c5]Cesare Svelto
, Andrey A. Zhirnov
Uncertainty Evaluation in Knife-Edge Laser Spot-Size Measurements for Industrial Applications. MetroXRAINE 2023: 335-340 - 2020
- [j17]Gianluca Galzerano
Accurate Measurement of Optical Resonator Finesse. IEEE Trans. Instrum. Meas. 69(11): 9119-9123 (2020)
2010 – 2019
- 2018
- [c4]Mario Christian Falconi, Dario Laneve
Continuous-Wave and Pulsed Optical Fiber Lasers for Medium Infrared Applications. ICTON 2018: 1-5 - 2017
- [c3]Alessandro Chiasera
Glass based structures fabricated by rf-sputtering. MIPRO 2017: 21-26 - 2016
- [c2]Alexey Pniov, Andrey A. Zhirnov
Fiber-pumped Yb Er: glass microchip laser for coherent OTDR sensing. I2MTC 2016: 1-5 - [c1]Toney Teddy-Fernández, Yuchen Wang
Dy3+ doped ZBLAN fiber amplifier pumped by a single frequency 1064 nm laser for mid infrared applications. ICTON 2016: 1-3
2000 – 2009
- 2008
- [j16]Alessandro Pesatori, Michele Norgia, V. Calabrese, Gianluca Galzerano
Optical Frequency Standard by HI Doppler-Broadened Absorption and External-Cavity Laser Diode at 1.541 muhboxm. IEEE Trans. Instrum. Meas. 57(8): 1708-1712 (2008) - [j15]Alessandro Pesatori, Gianluca Galzerano
Characterization of Single-Frequency Yb: hboxKYF4 Lasers at 1.03 muhboxm for Optical Frequency Metrology. IEEE Trans. Instrum. Meas. 57(8): 1713-1717 (2008) - 2007
- [j14]Gianluca Galzerano
Absolute Frequency Stabilization of Diode Lasers Around 0.94 μm. IEEE Trans. Instrum. Meas. 56(2): 365-368 (2007) - 2006
- [j13]Gianluca Galzerano
Frequency- and intensity-noise measurements of a widely tunable 2-μm Tm-Ho: KYF laser. IEEE Trans. Instrum. Meas. 55(1): 128-131 (2006) - 2005
- [j12]Elio Bava, Niccolò Beverini
Measurements of near-infrared frequency mixing by metal-semiconductor point-contact diodes. IEEE Trans. Instrum. Meas. 54(4): 1407-1411 (2005) - [j11]Cesare Svelto, Michele Norgia, Elio Bava, Gianluca Galzerano
FM spectroscopy of monodeuterated methane as a frequency standard at 1.54 μm. IEEE Trans. Instrum. Meas. 54(4): 1630-1633 (2005) - 2004
- [j10]Sergio De Ponte, Stefano Malavasi
Novel particle image velocimetry system based on three-color pulsed lamps and image processing. IEEE Trans. Instrum. Meas. 53(1): 175-180 (2004) - [j9]Marcello Marano, Gianluca Galzerano
Frequency stabilized Tm-Ho: YAG laser by locking to H79Br and CO2 transitions at around 2.09 μm. IEEE Trans. Instrum. Meas. 53(2): 571-574 (2004) - 2003
- [j8]Gianluca Galzerano
High-stability 72-GHz Gunn oscillator for the characterization of ultra-high-speed optical receivers based on InP and InSb Schottky diodes. IEEE Trans. Instrum. Meas. 52(4): 1190-1194 (2003) - [j7]Luca Callegaro
Precision impedance measurements by the three-voltage method with a novel high-stability multiphase DDS generator. IEEE Trans. Instrum. Meas. 52(4): 1195-1199 (2003) - 2002
- [j6]Cesare Svelto, Gianluca Galzerano
High-resolution spectroscopy of the 39K transitions at 770 nm and 13C2H2 saturated lines by a solid-state laser at 1.54 μm: toward an accurate frequency standard in the optical communication band. IEEE Trans. Instrum. Meas. 51(4): 764-769 (2002) - 2001
- [j5]Fabrizio Bertinetto, Paolo Cordiale, Gianluca Galzerano
Frequency stabilization of DBR diode laser against Cs absorption lines at 852 nm using the modulation transfer method. IEEE Trans. Instrum. Meas. 50(2): 490-492 (2001) - [j4]Cesare Svelto, Gianluca Galzerano
Nonlinear spectroscopy of isotopic acetylene at λ=1.5 μm for absolute frequency stabilization of diode-pumped Er-Yb: Glass lasers. IEEE Trans. Instrum. Meas. 50(2): 497-499 (2001) - [j3]Luca Callegaro
A multiphase direct-digital-synthesis sinewave generator for high-accuracy impedance comparison. IEEE Trans. Instrum. Meas. 50(4): 926-929 (2001) - [j2]Gianluca Galzerano
Diode-pumped 2 μm optical oscillator for high-resolution spectroscopy and frequency metrology. IEEE Trans. Instrum. Meas. 50(4): 1003-1006 (2001)
1990 – 1999
- 1999
- [j1]Gianluca Galzerano
Frequency stabilization of frequency-doubled Nd: YAG lasers at 532 nm by frequency modulation spectroscopy technique. IEEE Trans. Instrum. Meas. 48(2): 540-543 (1999)
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