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Uwe Paschen
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2010 – 2019
- 2015
- [c3]Andrei Schmidt, Stefan Dreiner, Holger Vogt, Uwe Paschen:
Thin-film SOI PIN-diode leakage current dependence on back-gate-potential and HCI traps. ESSDERC 2015: 290-293 - [c2]Holger Kappert, Norbert Kordas, Stefan Dreiner, Uwe Paschen, Rainer Kokozinski:
High temperature SOI CMOS technology and circuit realization for applications up to 300°C. ISCAS 2015: 1162-1165 - 2012
- [c1]Danilo Bronzi, Federica A. Villa, Simone Bellisai, Bojan Markovic, Simone Tisa, Alberto Tosi, Franco Zappa, Sascha Weyers, Daniel Durini, Werner Brockherde, Uwe Paschen:
Low-noise and large-area CMOS SPADs with timing response free from slow tails. ESSDERC 2012: 230-233
2000 – 2009
- 2006
- [j1]Axel Sikora, Frank-Peter Pesl, Walter Unger, Uwe Paschen:
Technologies and reliability of modern embedded flash cells. Microelectron. Reliab. 46(12): 1980-2005 (2006)
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