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Youngshin Han
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2010 – 2019
- 2019
- [j6]Jae Kwon Kim, Jong Sik Lee, Youngshin Han:
Fault Detection Prediction Using a Deep Belief Network-Based Multi-Classifier in the Semiconductor Manufacturing Process. Int. J. Softw. Eng. Knowl. Eng. 29(8): 1125-1139 (2019) - 2017
- [j5]Jaekwon Kim
, Youngshin Han, Jong Sik Lee:
Particle swarm optimization-deep belief network-based rare class prediction model for highly class imbalance problem. Concurr. Comput. Pract. Exp. 29(11) (2017) - 2016
- [j4]Jeongseok Choi, Taeyoung Kim, Jaekwon Kim, Sunghwan Moon, Youngshin Han, Jongsik Lee:
Data collection model in hybrid network for participatory sensing. Int. J. Model. Simul. Sci. Comput. 7(4): 1643002:1-1643002:7 (2016) - [c17]Jae Kwon Kim, Kyu Cheol Cho, Jong Sik Lee, Youngshin Han:
Feature Selection Techniques for Improving Rare Class Classification in Semiconductor Manufacturing Process. BDTA 2016: 40-47 - 2014
- [c16]Jaekwon Kim, Taeyoung Kim, Minoh Park, Youngshin Han, Jongsik Lee:
Fuzzy-Based Resource Reallocation Scheduling Model in Cloud Computing. FCC 2014: 43-48 - [c15]Tae-young Kim, Youngshin Han, Jaekwon Kim, Jong Sik Lee:
Fuzzy Logic-Based Adaptive Communication Management on Wireless Network. ICCCI 2014: 40-48 - 2011
- [j3]Jin Myoung Kim, Youngshin Han, Hae Young Lee
Path Renewal Method in Filtering Based Wireless Sensor Networks. Sensors 11(2): 1396-1404 (2011) - [c14]You su Mok, Dongsik Park, Chilgee Lee, Youngshin Han:
A Production Planning Methodology for Semiconductor Manufacturing Based on Simulation and Marketing Pattern. ACIIDS (2) 2011: 363-371 - 2010
- [j2]Youngshin Han, SoYoung Kim, Taekyu Kim, Jason J. Jung
Automatic Defect Classification System in Semiconductors EDS Test Based on System Entity Structure Methodology. IEICE Trans. Inf. Syst. 93-D(7): 2001-2004 (2010) - [j1]Dosam Hwang, Ngoc Thanh Nguyen, Jason J. Jung, Abolghasem Sadeghi-Niaraki, Kwang-Hyun Baek, Youngshin Han:
A Semantic Wiki Framework for Reconciling Conflict Collaborations Based on Selecting Consensus Choice. J. Univers. Comput. Sci. 16(7): 1024-1035 (2010) - [c13]Chungman Seo, Youngshin Han, Hae Young Lee, Jason J. Jung
Implementation of Cloud Computing Environment for Discrete Event System Simulation using Service Oriented Architecture. EUC 2010: 359-362 - [c12]Youngshin Han, Taekyu Kim, Chungman Seo, Chilgee Lee:
System entity structure for XML meta data modeling: application to the logistics. SpringSim 2010: 134 - [c11]Youngshin Han, Chilgee Lee:
Two-way material transportation method based on 300mm wafer FAB line simulation. SpringSim 2010: 227
2000 – 2009
- 2009
- [c10]Jason J. Jung, Youngshin Han:
Conceptual Modeling of Semantic Service Chain Management for Building Service Networks: A Preliminary Result. KES-AMSTA 2009: 481-489 - [c9]Youngshin Han, Chilgee Lee, Jason J. Jung:
Redundancy analysis simulation in semiconductor manufacturing for yield improvement. SpringSim 2009 - 2008
- [c8]Taekyu Kim, Youngshin Han, Tae-young Kim, Jong Sik Lee:
Ontology Methodology Based Context Awareness Using System Entity Structure for Network Analysis. KES-AMSTA 2008: 232-241 - 2006
- [c7]Dongsik Park, Youngshin Han, Chilgee Lee:
Optimization of a Simulation for 300mm FAB Semiconductor Manufacturing. ICCSA (5) 2006: 260-268 - 2005
- [c6]Yan Ha, Hea-Sook Park, Soon-Mi Lee, Young-Whan Park, Youngshin Han:
Design and Implementation of SMS Security System for Wireless Environment. KES (2) 2005: 1062-1068 - [c5]Youngshin Han, Junghee Kim, Chilgee Lee:
Automatic Detection of Failure Patterns Using Data Mining. KES (2) 2005: 1312-1316 - [c4]Youngshin Han, Chilgee Lee:
Automatic Classification Using Decision Tree and Support Vector Machine. KES (2) 2005: 1325-1330 - 2004
- [c3]Youngshin Han, Dongsik Park, Sangwon Chae, Chilgee Lee:
Full Fabrication Simulation of 300mm Wafer Focused on AMHS (Automated Material Handling Systems). AsiaSim 2004: 514-520 - [c2]Youngshin Han, Dongsik Park, Chilgee Lee:
On the Repair of Memory Cells with Spare Rows and Columns for Yield Improvement. AsiaSim 2004: 713-720 - [c1]Youngshin Han, Chilgee Lee:
RRAM Spare Allocation in Semiconductor Manufacturing for Yield Improvement. KES 2004: 95-102
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