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J. H. Lee
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2020 – today
- 2024
- [c35]H. C. Chang, P. J. Liao, S. H. Chen, Y. K. Chang, C. P. Li, W. C. Liao, M. H. Hsieh, H. W. Yang, J. H. Lee, C. M. Huang, Jun He:
Enhancing EM Reliability and Lifetime Modeling: A Multi-Link Structure Approach. IRPS 2024: 1-4 - [c34]C. H. Chiang, K. P. Sou, D. S. Huang, J. H. Lee:
A Comprehensive Hot Carrier Injection with Voltage Ramp Stress (HCI-VRS) through Different Model Verification for More than Moore Diversity Application. IRPS 2024: 1-4 - [c33]K. S. Choi, S. H. Kim, J. W. Seo, H. S. Kang, S. W. Chu, S. W. Bae, J. H. Kwon, G. S. Kim, Y. T. Park, J. H. Kwak, D. I. Song, S. M. Park, Y. T. Kim, K. C. Jang, J. S. Cho, H. S. Lee, B. H. Lee, J. W. Park, J. H. Lee, H. H. Kwon, D. S. You, C. S. Hyun, J. J. Lee, S. C. Lee, I. D. Kim, J. H. Myung, H. S. Won, J. H. Chun, K. H. Kim, J. H. Kang, S. B. Kim, K. H. Lee, S. O. Chung, S. S. Kim, I. S. Jin, B. K. Lee, C. W. Kim, J. Park, S. Y. Cha:
A Three Dimensional DRAM (3D DRAM) Technology for the Next Decades. VLSI Technology and Circuits 2024: 1-2 - [c32]J.-H. Yoo, Y.-S. Jeon, S.-W. Son, I.-G. Lee, H.-B. Jo, S.-M. Choi, M.-S. Yu, W.-S. Park, H.-J. Kim, H.-J. Lee, S.-P. Son, S. K. Kim, J. Yun, J.-P. Shim, H. Jang, K. Lee, Y. Jeong, T. Kim, C.-S. Shin, T.-W. Kim, J.-H. Lee, K.-S. Seo, K. Yang, D.-H. Kim:
Single-Power-Supply Compatible Cryogenic In0.8Ga0.2As Quantum-well HEMTs with Record Combination of high-frequency and low-noise performance for quantum-computins applications. VLSI Technology and Circuits 2024: 1-2 - 2023
- [c31]P. C. Chang, P. J. Liao, C. H. Wu, Y. C. Chang, D. H. Hou, Elia Ambrosi, H. Y. Lee, J. H. Lee, X. Y. Bao:
A New Ramp Stress Reliability Assessment on Pulse Energy Based OTS Switching Operation. IRPS 2023: 1-5 - [c30]J. H. Lee, B. W. Woo, Y. M. Lee, N. H. Lee, S. H. Lee, Y. S. Lee, H. S. Kim, S. Pae:
Reliability Improvement with Optimized BEOL Process in Advanced DRAM. IRPS 2023: 1-4 - [c29]Hideo Sato, H. M. Shin, H. Jung, S. W. Lee, H. Bae, H. Kwon, K. H. Ryu, W. C. Lim, Y. S. Han, J. H. Jeong, J. M. Lee, D. S. Kim, K. Lee, J. H. Lee, J. H. Park, Y. J. Song, Y. Ji, B. I. Seo, J. W. Kim, H. H. Kim:
Comprehensive study on prediction of endurance properties from breakdown voltage in high-reliable STT-MRAM. IRPS 2023: 1-5 - [c28]Jung-Won Han, S. H. Park, Moonyoung Jeong, K. N. Kim, H. J. Kim, J. C. Shin, S. M. Park, S. H. Shin, S. W. Park, K. S. Lee, J. H. Lee, S. H. Kim, B. C. Kim, Myoung H. Jung, I. Y. Yoon, H. Kim, S. U. Jang, K. J. Park, Y. K. Kim, I. G. Kim, J. H. Oh, S. Y. Han, B. S. Kim, Bong Jin Kuh, J. M. Park:
Ongoing Evolution of DRAM Scaling via Third Dimension -Vertically Stacked DRAM -. VLSI Technology and Circuits 2023: 1-2 - [c27]S. Ko, J. H. Park, J. H. Bak, H. Jung, J. Shim, D. S. Kim, W. Lim, D.-E. Jeong, J. H. Lee, K. Lee, J.-H. Park, Y. Kim, C. Kim, J. H. Jeong, C. Y. Lee, S. H. Han, Y. Ji, S. H. Hwang, Hye Ji Shin, K. Lee, Y. J. Song, Yu-Gyun Shin, J. H. Song:
Highly Reliable and Manufacturable MRAM embedded in 14nm FinFET node. VLSI Technology and Circuits 2023: 1-2 - [c26]J.-H. Yoo, H.-B. Jo, I.-G. Lee, S.-M. Choi, J.-M. Baek, S. T. Lee, H. Jang, M. W. Kong, H. H. Kim, H. J. Lee, H.-J. Kim, H.-S. Jeong, W.-S. Park, D.-H. Ko, S. H. Shin, H.-M. Kwon, S. K. Kim, J. G. Kim, J. Yun, T. Kim, K.-Y. Shin, T.-W. Kim, J.-K. Shin, J.-H. Lee, C.-S. Shin, K.-S. Seo, Dae-Hyun Kim:
Lg = 60 nm In0.53 Ga0.47 As MBCFETs: From gm_max = 13.7 mS/üm and Q = 180 to virtual-source modeling. VLSI Technology and Circuits 2023: 1-2 - 2022
- [c25]Y. K. Chang, P. J. Liao, S. H. Yeong, Y.-M. Lin, J. H. Lee, C. T. Lin, Z. Yu, Wilman Tsai, Paul C. McIntyre:
The Field-dependence Endurance Model and Its Mutual Effect in Hf-based Ferroelectrics. IRPS 2022: 3 - [c24]P. C. Chang, P. J. Liao, D. W. Heh, C. Lee, D. H. Hou, Elia Ambrosi, C. H. Wu, H. Y. Lee, J. H. Lee, Xinyu Bao:
Investigation of First Fire Effect on VTH Stability and Endurance in GeCTe Selector. IRPS 2022: 4 - [c23]P. S. Chen, Y. W. Lee, D. S. Huang, S. C. Chen, C. F. Cheng, J. H. Lee, Jun He:
AC TDDB Analysis for HK/IL Gate Stack Breakdown and Frequency-dependent Oxygen Vacancy Trap Generation in Advanced nodes FinFET Devices by SILC Spectrum Methodology. IRPS 2022: 11 - [c22]H.-B. Jo, I.-G. Lee, J.-M. Baek, S. T. Lee, S.-M. Choi, H.-J. Kim, H.-S. Jeong, W.-S. Park, J.-H. Yoo, H.-Y. Lee, D. Y. Yun, S.-W. Son, D.-H. Ko, Tae-Woo Kim, H.-M. Kwon, S.-K. Kim, Jun-Gyu Kim, J. Yun, T. Kim, J. H. Lee, J.-H. Lee, C.-S. Shin, K.-S. Seo, Dae-Hyun Kim:
Lg = 130 nm GAA MBCFETs with three-level stacked In0.53Ga0.47As nanosheets. VLSI Technology and Circuits 2022: 397-398 - [c21]H.-B. Jo, I.-G. Lee, J.-M. Baek, S. T. Lee, S.-M. Choi, H.-J. Kim, H.-S. Jeong, W.-S. Park, J.-H. Yoo, H.-Y. Lee, D. Y. Yun, S.-W. Son, D.-H. Ko, Tae-Woo Kim, H.-M. Kwon, S.-K. Kim, Jun-Gyu Kim, J. Yun, T. Kim, J. H. Lee, J.-H. Lee, C.-S. Shin, K.-S. Seo, Dae-Hyun Kim:
Lg = 130 nm GAA MBCFETs with three-level stacked In0.53Ga0.47As nanosheets. VLSI Technology and Circuits 2022: 397-398 - 2020
- [c20]Hyun-Chul Park, D. Kang, S. M. Lee, B. Park, K. Kim, Jooseok Lee, Y. Aoki, Y. Yoon, S. Lee, D. Lee, D. Kwon, Seokhyeon Kim, J. Kim, W. Lee, C. Kim, S. Park, J. Park, B. Suh, J. Jang, M. Kim, Donggyu Minn, I. Park, S. Kim, K. Min, S. Jeon, A.-S. Ryu, Y. Cho, S. T. Choi, K. H. An, Y. Kim, J. H. Lee, Jae-Ick Son, Sung-Gi Yang:
4.1 A 39GHz-Band CMOS 16-Channel Phased-Array Transceiver IC with a Companion Dual-Stream IF Transceiver IC for 5G NR Base-Station Applications. ISSCC 2020: 76-78
2010 – 2019
- 2019
- [c19]Y. Ji, H. J. Goo, J. Lim, S. B. Lee, S. Lee, Taiki Uemura, J. C. Park, S. I. Han, S. C. Shin, J. H. Lee, Y. J. Song, K. M. Lee, H. M. Shin, S. H. Hwang, B. Y. Seo, Y. K. Lee, J. C. Kim, Gwanhyeob Koh, K. C. Park, Sangwoo Pae, Gi-Tae Jeong, J. S. Yoon, E. S. Jung:
Reliability of 8Mbit Embedded-STT-MRAM in 28nm FDSOI Technology. IRPS 2019: 1-3 - 2018
- [c18]J. H. Lee, D. Kim, T. J. Kim, H. N. Byun, C. G. Kim:
A new approach to motion judder cancellation: Time stamp model using instant frame rate. ICCE 2018: 1-4 - [c17]I. K. Chen, S. C. Chen, S. Mukhopadhyay, D. S. Huang, J. H. Lee, Y. S. Tsai, Ryan Lu, Jun He:
The physical mechanism investigation of off-state drain bias TDDB and its implication in advance HK/MG FinFETs. IRPS 2018: 4 - [c16]D. S. Huang, J. H. Lee, Y. S. Tsai, Y. F. Wang, Y. S. Huang, C. K. Lin, Ryan Lu, Jun He:
Comprehensive device and product level reliability studies on advanced CMOS technologies featuring 7nm high-k metal gate FinFET transistors. IRPS 2018: 6 - 2017
- [c15]Seongmo Park, Byoung Gun Choi, Kwang-Il Oh, S. E. Kim, J. H. Lee, J. J. Lee, Sung Weon Kang:
Image compression based on MR-CNN (Modified Region Convolutional Neural Network). ISOCC 2017: 292-293 - [c14]S. W. Lee, J.-H. Lee, H. G. Kwon, Thomas Laurell, Ok Chan Jeong, S. Kim:
A sol-gel integrated dual-readout microarray platform for quantification and identification of prostate-specific antigen. MHS 2017: 1-3 - [c13]Guohan Hu, J. J. Nowak, G. Lauer, J. H. Lee, J. Z. Sun, J. Harms, Anthony J. Annunziata, S. Brown, W. Chen, Y. H. Kim, N. Marchack, S. Murthy, Chandrasekharan Kothandaraman, Eugene J. O'Sullivan, J. H. Park, M. Reuter, R. P. Robertazzi, Philip Louis Trouilloud, Y. Zhu, Daniel Christopher Worledge:
Low-current Spin Transfer Torque MRAM. VLSI-DAT 2017: 1-2 - 2015
- [c12]Wenyi Zhang, M. C. Silvestre, A. Selvam, E. Ramanathan, C. Ordonio, J. Schaller, Tian Shen, Kong Boon Yeap, C. Capasso, Patrick Justison, J. H. Lee:
An investigation of process dependence of porous IMD TDDB. IRPS 2015: 1 - 2014
- [c11]D. Kim, Y. S. Cho, J. H. Lee, H. N. Byun, C. G. Kim:
Real-time FPGA implementation of Full HD@120Hz frame rate up-conversion system. ICCE 2014: 109-110 - 2013
- [c10]Rossi Kamal, J. H. Lee, C. K. Hwang, S. I. Moon, Choong Seon Hong, Mi-Jung Choi:
Psychic: An autonomic inference engine for M2M management in Future Internet. APNOMS 2013: 1-6 - 2012
- [j9]I. J. Kim, H. K. Moon, J. H. Lee, Nae-Eung Lee
, J. W. Jung, S. H. Cho:
Silicon nitride etch characteristics in SF6/O2 and C3F6O/O2 plasmas and evaluation of their global warming effects. Microelectron. Reliab. 52(12): 2970-2974 (2012) - 2010
- [j8]C.-H. Lee, J.-H. Lee, O.-S. Shin, S.-C. Kim:
Sum rate analysis of multiantenna multiuser relay channel. IET Commun. 4(17): 2032-2040 (2010) - [j7]Sang Hyo Woo, Ki Won Yoon, Yeon Kwan Moon, J. H. Lee, Hee Joon Park, T. W. Kim, H. C. Choi, Chul-Ho Won, Jin-Ho Cho:
High Speed Receiver for Capsule Endoscope. J. Medical Syst. 34(5): 843-847 (2010)
2000 – 2009
- 2008
- [j6]Susan J. Lederman, Roberta L. Klatzky, E. Rennert-May, J. H. Lee, K. Ng, Cheryl L. Hamilton:
Haptic Processing of Facial Expressions of Emotion in 2D Raised-Line Drawings. IEEE Trans. Haptics 1(1): 27-38 (2008) - [i1]Ruey-Fang Shyu, Hsiharng Yang, J.-H. Lee:
Micro-electroforming metallic bipolar electrodes for mini-DMFC stacks. CoRR abs/0805.0898 (2008) - 2007
- [c9]Chang Wook Kim, Zia Mohy-Ud-Din, Sang Hyo Woo, J. H. Lee, Hee Joon Park, I. Y. Park, Myoung Nam Kim, Chul-Ho Won, Jin-Ho Cho:
Automatic Detection Algorithm for Residual Quantity of Ringer's Solution. BIOCOMP 2007: 491-496 - [c8]J.-H. Lee, Y.-L. Chen:
Adaptive beamforming using uniform circular arrays under mutual coupling environments. SIP 2007: 318-322 - 2006
- [j5]E. S. Son, K. H. Han, J. H. Lee, Y. C. Chung:
Survivable Network Architectures for Wavelength-division-multiplexed Passive Optical Networks. Photonic Netw. Commun. 12(1): 111-115 (2006) - 2005
- [j4]J. S. Yim, J. H. Lee, Y. D. Jang, Moon-Deock Kim
Optical characteristics of In(Ga)As quantum dots on (100) InP substrate for 1.5mum laser diodes. Microelectron. J. 36(3-6): 190-193 (2005) - 2004
- [j3]Y. H. Kim, Rino Choi
Reliability of High-K Dielectrics and Its Dependence on Gate Electrode and Interfacial / High-K Bi-Layer Structure. Microelectron. Reliab. 44(9-11): 1513-1518 (2004) - 2003
- [c7]J. J. Lee, J. H. Lee, K. Y. Lee:
Efficient speech enhancement based on left-right HMM with state sequence detection using LRT. INTERSPEECH 2003: 1385-1388 - [c6]J. H. Lee, S. H. Chae, H. W. Suh:
XML based information exchange between PDM systems in CPC environment. CE 2003: 947-956 - [c5]J. H. Lee, S. H. Chae, H. W. Suh, K.-E. Kwon, Y. Choi, S. W. Cho:
The extension of STEP PDM schema for information sharing in a practical application. CE 2003: 957-965 - 2001
- [c4]Dongqing Chen, Lihong Li, Daeki Yoon, J. H. Lee, Zhengrong Liang:
Renormalization method for inhomogeneity correction of MR images. Image Processing 2001 - 2000
- [c3]J. Lee, D. Kong, J. Chun, J. H. Lee, S. Y. Lee, S. J. Lee, J. C. Yun:
Software Environment for Evaluating Performance of Space-Time CDMA Receivers. ICC (1) 2000: 200-204 - [c2]Hyouk Ryeol Choi, S. M. Ryew, T. H. Kang, J. H. Lee, H. M. Kim:
A wall climbing robot with closed link mechanism. IROS 2000: 2006-2011
1990 – 1999
- 1999
- [j2]J. H. Lee, H. Y. Cho, H. R. Park:
n-Gram-based indexing for Korean text retrieval. Inf. Process. Manag. 35(4): 427-441 (1999) - 1998
- [c1]J. H. Lee, J. H. Roh, Jonghyung Kwun, Chul-Hee Kang:
A controlled distributed antenna system for increasing Eb/Io in the DS-CDMA system. PIMRC 1998: 1401-1405 - 1990
- [j1]J.-H. Lee, T.-T. Young:
New polyphase filter bank-based analysis/synthesis systems. IEEE Trans. Acoust. Speech Signal Process. 38(5): 876-880 (1990)
Coauthor Index
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