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Ilgu Yun
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2020 – today
- 2022
- [c6]Seungju Hwang, Ilgu Yun:
Self-heating effect of GAAFET and FinFET for over 2-V applications using TCAD simulation. ICEIC 2022: 1-4
2010 – 2019
- 2018
- [c5]Sang Myung Lee, Ilgu Yun:
Modeling and Simulation of Novel GaN-based Light Emitting Transistor for Display Applications. PRIME 2018: 269-272 - [c4]Min Soo Bae, Chuntaek Park, Ilgu Yun:
Compact Drain Current Model of Nanoscale FinFET Considering Short Channel Effect in Ballistic Transport Regime. SMACD 2018: 1-112 - 2017
- [j23]Chuntaek Park
, Ilgu Yun:
Mechanical stress-induced degradation model of amorphous InGaZnO thin film transistors by strain-initiated defect generation. Microelectron. Reliab. 76-77: 592-595 (2017) - [j22]Sang Myung Lee, Ilgu Yun:
Effect of selectively passivated layer on foldable low temperature polycrystalline silicon thin film transistor characteristics under dynamic mechanical stress. Microelectron. Reliab. 76-77: 606-609 (2017) - [j21]Dongseok Shin, Byungchoul Park, Youngcheol Chae
Structure variation effects on device reliability of single photon avalanche diodes. Microelectron. Reliab. 76-77: 610-613 (2017) - 2016
- [j20]Sang Myung Lee, Chuntaek Park, Ilgu Yun:
Crack-guided effect on dynamic mechanical stress for foldable low temperature polycrystalline silicon thin film transistors. Microelectron. Reliab. 64: 84-87 (2016) - [j19]Dongseok Shin, Min Soo Bae, Ilgu Yun:
Instability of oxide thin film transistor under electrical-mechanical hybrid stress for foldable display. Microelectron. Reliab. 64: 109-112 (2016) - [j18]In Joong Kim, Ilgu Yun
Plasma Process Uniformity Diagnosis Technique Using Optical Emission Spectroscopy With Spatially Resolved Ring Lens. IEEE Trans. Ind. Electron. 63(9): 5674-5681 (2016) - 2015
- [j17]Edward Namkyu Cho, Yong-Hyeon Shin, Ilgu Yun:
An analytical avalanche breakdown model for double gate MOSFET. Microelectron. Reliab. 55(1): 38-41 (2015) - [j16]Pyung Moon, Jun Yeong Lim, Tae-Un Youn, Keum-Whan Noh, Ilgu Yun:
Effect of electric field polarity on inter-poly dielectric during cell operation for the retention characteristics. Microelectron. Reliab. 55(5): 795-798 (2015) - [j15]Jun Yeong Lim, Ilgu Yun:
Reliability modeling and analysis of flicker noise for pore structure in amorphous chalcogenide-based phase-change memory devices. Microelectron. Reliab. 55(9-10): 1320-1322 (2015) - 2014
- [j14]Jung Han Kang, Edward Namkyu Cho, Ilgu Yun:
Conduction instability of amorphous InGaZnO thin-film transistors under constant drain current stress. Microelectron. Reliab. 54(9-10): 2164-2166 (2014) - 2013
- [j13]Pyung Moon, Jun Yeong Lim, Tae-Un Youn, Keum-Whan Noh, Sung-Kye Park, Ilgu Yun:
Methodology for improvement of data retention in floating gate flash memory using leakage current estimation. Microelectron. Reliab. 53(9-11): 1338-1341 (2013) - 2012
- [j12]Edward Namkyu Cho, Pyung Moon, Chang Eun Kim, Ilgu Yun:
Modeling and optimization of ITO/Al/ITO multilayer films characteristics using neural network and genetic algorithm. Expert Syst. Appl. 39(10): 8885-8889 (2012) - [j11]Mingu Kang, Ilgu Yun:
Experimental observation of gate geometry dependent characteristic degradations of the multi-finger MOSFETs. Microelectron. Reliab. 52(9-10): 1936-1939 (2012) - [j10]Suehye Park, Edward Namkyu Cho, Ilgu Yun:
Threshold voltage shift prediction for gate bias stress on amorphous InGaZnO thin film transistors. Microelectron. Reliab. 52(9-10): 2215-2219 (2012) - 2011
- [j9]Chang Eun Kim, Pyung Moon, Ilgu Yun, Sungyeon Kim
Process estimation and optimized recipes of ZnO: Ga thin film characteristics for transparent electrode applications. Expert Syst. Appl. 38(3): 2823-2827 (2011) - [j8]Edward Namkyu Cho, Jung Han Kang, Ilgu Yun:
Effects of channel thickness variation on bias stress instability of InGaZnO thin-film transistors. Microelectron. Reliab. 51(9-11): 1792-1795 (2011)
2000 – 2009
- 2009
- [j7]Young-Don Ko, Pyung Moon, Chang Eun Kim, Moon-Ho Ham, Jae-Min Myoung, Ilgu Yun:
Modeling and optimization of the growth rate for ZnO thin films using neural networks and genetic algorithms. Expert Syst. Appl. 36(2): 4061-4066 (2009) - [j6]Keun Ho Rhew, Su Chang Jeon, Dae Hee Lee, Byueng-Su Yoo, Ilgu Yun:
Reliability assessment of 1.55-µm vertical cavity surface emitting lasers with tunnel junction using high-temperature aging tests. Microelectron. Reliab. 49(1): 42-50 (2009) - 2008
- [j5]Jung Hwan Lee, Dong-Hun Kang, Young-Don Ko, Jaejin Jang, Dae-Shik Seo, Ilgu Yun:
Neural network modeling of the cellgap process for liquid crystal display fabricated on plastic substrates. Expert Syst. Appl. 35(3): 1311-1315 (2008) - 2007
- [j4]Kyoung Eun Kweon, Jung Hwan Lee, Young-Don Ko, Min-Chang Jeong, Jae-Min Myoung, Ilgu Yun:
Neural network based modeling of HfO2 thin film characteristics using Latin Hypercube Sampling. Expert Syst. Appl. 32(2): 358-363 (2007) - [j3]Han Sung Joo, Sang-Wan Ryu, Jeha Kim, Ilgu Yun:
Degradation analysis in asymmetric sampled grating distributed feedback laser diodes. Microelectron. J. 38(6-7): 740-745 (2007) - [c3]Young-Don Ko, Moon-Ho Ham, Jae-Min Myoung, Ilgu Yun:
Effect of the principal component on the PCA-based neural network model for HFO2 thin film characteristics. Artificial Intelligence and Applications 2007: 255-261 - 2006
- [j2]Myoung-Seok Kim, Young-Don Ko, Tae-Houng Moon, Jae-Min Myoung, Ilgu Yun:
Modeling growth rate of HfO2 thin films grown by metal-organic molecular beam epitaxy. Microelectron. J. 37(2): 98-106 (2006) - [c2]Jung Hwan Lee, Young-Don Ko, Min-Chang Jeong, Jae-Min Myoung, Ilgu Yun:
PCA-Based Neural Network Modeling Using the Photoluminescence Data for Growth Rate of ZnO Thin Films Fabricated by Pulsed Laser Deposition. ISNN (2) 2006: 1099-1104 - 2004
- [j1]Bongyong Lee, Hongil Yoon, Kyung Sook Hyun, Yong Hwan Kwon, Ilgu Yun:
Investigation of manufacturing variations of planar InP/InGaAs avalanche photodiodes for optical receivers. Microelectron. J. 35(8): 635-640 (2004) - [c1]Byung In Moon, Hongil Yoon, Ilgu Yun, Sungho Kang:
An In-Order SMT Architecture with Static Resource Partitioning for Consumer Applications. PDCAT 2004: 539-544
Coauthor Index
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