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Le Jin
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2020 – today
- 2023
- [c22]Yinan Zhang, Huiqi Hu, Xuan Zhou, Enlong Xie, Hongdi Ren, Le Jin:
PM-Blade: A Persistent Memory Augmented LSM-tree Storage for Database. ICDE 2023: 3363-3375 - [c21]Teng Zhang, Minghui Yang, Le Jin, Guoshun Zhou, Xuefeng Zhao, Chao Shi, Xingyu Yuan, Liang Zhou, Liang Chang, Jun Zhou:
A FPGA-Based Iterative 6DoF Pose Refinement Processing Unit for Fast and Energy-Efficient Pose Estimation in Picking Robots. IECON 2023: 1-6
2010 – 2019
- 2012
- [j10]Jingbo Duan, Le Jin, Degang Chen:
Testing ADC Spectral Performance Without Dedicated Data Acquisition. IEEE Trans. Instrum. Meas. 61(11): 2941-2952 (2012) - 2011
- [j9]Le Jin:
Application of the Kalman Filter in Linearity Testing of Analog-to-Digital Converters. J. Electron. Test. 27(2): 163-175 (2011) - 2010
- [j8]Le Jin, Lin Liang:
A power-of-two FFT algorithm and structure for DRM receiver. IEEE Trans. Consumer Electron. 56(4): 2061-2066 (2010) - [c20]Jingbo Duan, Le Jin, Degang Chen:
INL based dynamic performance estimation for ADC BIST. ISCAS 2010: 3028-3031 - [c19]Jingbo Duan, Le Jin, Degang Chen:
A new method for estimating spectral performance of ADC from INL. ITC 2010: 694-703
2000 – 2009
- 2009
- [j7]Le Jin, Degang Chen, Randall L. Geiger:
Code-Density Test of Analog-to-Digital Converters Using Single Low-Linearity Stimulus Signal. IEEE Trans. Instrum. Meas. 58(8): 2679-2685 (2009) - [c18]Sehun Kook, Hyun Woo Choi, Vishwanath Natarajan, Abhijit Chatterjee, Alfred V. Gomes, Shalabh Goyal, Le Jin:
Low Cost Dynamic Test Methodology for High Precision ΣD ADCs. Asian Test Symposium 2009: 69-74 - [c17]Jin Yu, Limin Zhi, Yunming Qiu, Le Jin, Hailu Du:
Grey Synthetical Prediction Model of Military Logistics Based on Evolutionary Neural Network. CSO (1) 2009: 663-665 - [c16]Sehun Kook, Vishwanath Natarajan, Abhijit Chatterjee, Shalabh Goyal, Le Jin:
Testing of High Resolution ADCs Using Lower Resolution DACs via Iterative Transfer Function Estimation. ETS 2009: 3-8 - 2008
- [j6]Liang Chen, Le Jin, Feng He, Hanwen Cheng, Lenan Wu:
Dynamic Network Selection for Multicast Services in Wireless Cooperative Networks. IEICE Trans. Commun. 91-B(10): 3069-3076 (2008) - [j5]Le Jin, Hosam Haggag, Randall L. Geiger, Degang Chen:
Testing of Precision DAC Using Low-Resolution ADC With Wobbling. IEEE Trans. Instrum. Meas. 57(5): 940-946 (2008) - [c15]Hanqing Xing, Degang Chen, Randall L. Geiger, Le Jin:
System identification -based reduced-code testing for pipeline ADCs' linearity test. ISCAS 2008: 2402-2405 - [c14]Le Jin:
Linearity Test Time Reduction for Analog-to-Digital Converters Using the Kalman Filter with Experimental Parameter Estimation. ITC 2008: 1-8 - 2007
- [j4]Chengming He, Le Jin, Degang Chen, Randy Geiger:
Robust High-Gain Amplifier Design Using Dynamical Systems and Bifurcation Theory With Digital Postprocessing Techniques. IEEE Trans. Circuits Syst. I Regul. Pap. 54-I(5): 964-973 (2007) - [j3]Le Jin, Degang Chen, Randall L. Geiger:
SEIR Linearity Testing of Precision A/D Converters in Nonstationary Environments With Center-Symmetric Interleaving. IEEE Trans. Instrum. Meas. 56(5): 1776-1785 (2007) - [c13]Le Jin, Degang Chen, Randall L. Geiger:
Code-Density Test of Analog-to-Digital Converters Using Single Low-Linearity Stimulus Signal. VTS 2007: 303-310 - 2006
- [c12]Le Jin, Hanqing Xing, Degang Chen, Randall L. Geiger:
A self-calibrated bandgap voltage reference with 0.5 ppm/°C temperature coefficient. ISCAS 2006 - [c11]Hanqing Xing, Le Jin, Degang Chen, Randall L. Geiger:
Characterization of a current-mode bandgap circuit structure for high-precision reference applications. ISCAS 2006 - [c10]Le Jin, Degang Chen, Randall L. Geiger:
Linearity Test of Analog-to-Digital Converters Using Kalman Filtering. ITC 2006: 1-9 - [c9]Le Jin, Hosam Haggag, Randall L. Geiger, Degang Chen:
Testing of Precision DACs Using Low-Resolution ADCs with Dithering. ITC 2006: 1-10 - 2005
- [j2]Le Jin, Kumar L. Parthasarathy, Turker Kuyel, Degang Chen, Randall L. Geiger:
Accurate testing of analog-to-digital converters using low linearity signals with stimulus error identification and removal. IEEE Trans. Instrum. Meas. 54(3): 1188-1199 (2005) - [c8]Le Jin, Degang Chen, Randall L. Geiger:
A digital self-calibration algorithm for ADCs based on histogram test using low-linearity input signals. ISCAS (2) 2005: 1378-1381 - [c7]Wenbo Liu, Hanqing Xing, Le Jin, Randall L. Geiger, Degang Chen:
A test strategy for time-to-digital converters using dynamic element matching and dithering. ISCAS (4) 2005: 3809-3812 - [c6]Le Jin, Kumar L. Parthasarathy, Turker Kuyel, Randall L. Geiger, Degang Chen:
High-performance ADC linearity test using low-precision signals in non-stationary environments. ITC 2005: 10 - 2004
- [c5]Chengming He, Le Jin, Degang Chen, Randall L. Geiger:
Robust design of high gain amplifiers using dynamical systems and bifurcation theory. ISCAS (1) 2004: 481-484 - [c4]Le Jin, Chengming He, Degang Chen, Randall L. Geiger:
An SoC compatible linearity test approach for precision ADCs using easy-to-generate sinusoidal stimuli. ISCAS (1) 2004: 928-931 - [c3]Le Jin, Chengming He, Degang Chen, Randall L. Geiger:
Fast implementation of a linearity test approach for high-resolution ADCs using non-linear ramp signals. ISCAS (1) 2004: 932-935 - 2003
- [j1]Kumar L. Parthasarathy, Turker Kuyel, Dana Price, Le Jin, Degang Chen, Randall L. Geiger:
BIST and production testing of ADCs using imprecise stimulus. ACM Trans. Design Autom. Electr. Syst. 8(4): 522-545 (2003) - [c2]Kumar L. Parthasarathy, Le Jin, Turker Kuyel, Dana Price, Degang Chen, Randall L. Geiger:
Experimental evaluation and validation of a BIST algorithm for characterization of A/D converter performance. ISCAS (5) 2003: 537-540 - [c1]Le Jin, Kumar L. Parthasarathy, Turker Kuyel, Degang Chen, Randall L. Geiger:
Linearity Testing of Precision Analog-to-Digital Converters Using Stationary Nonlinear Inputs. ITC 2003: 218-227
Coauthor Index
aka: Randy Geiger
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