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Patrick Fiorenza
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2020 – today
- 2023
- [c6]Beatrice Carbone, Mario Santo Alessandrino, Alfio Russo, Elisa Vitanza, Filippo Giannazzo, Patrick Fiorenza, Fabrizio Roccaforte:
Carrot-like crystalline defects on the 4H-SiC powerMOSFET yield and reliability. IRPS 2023: 1-5 - [c5]Patrick Fiorenza, Francesco Cordiano, Mario Santo Alessandrino, Alfio Russo, Edoardo Zanetti, Mario Saggio, C. Bongiorno, Filippo Giannazzo, Fabrizio Roccaforte:
Consideration on the extrapolation of the low insulator field TDDB in 4H-SiC power MOSFETs. IRPS 2023: 1-4 - 2022
- [c4]Patrick Fiorenza, Corrado Bongiorno, Angelo Alberto Messina
, Mario Saggio, Filippo Giannazzo, Fabrizio Roccaforte:
SiO2/4H-SiC interfacial chemistry as origin of the threshold voltage instability in power MOSFETs. IRPS 2022: 3 - [c3]Marcello Cioni, Patrick Fiorenza, Fabrizio Roccaforte, Mario Saggio, Salvatore Cascino, Angelo Alberto Messina
Identification of Interface States responsible for VTH Hysteresis in packaged SiC MOSFETs. IRPS 2022: 5 - [c2]Mario Santo Alessandrino, Beatrice Carbone, Francesco Cordiano, Bruna Mazza, Alfio Russo, W. Coco, Massimo Boscaglia, A. Di Salvo, A. Lombardo, D. Scarcella, Elisa Vitanza, Patrick Fiorenza:
Failure analysis addressing method of optically undetected defectivity on 4H-SiC PowerMOSFET epitaxial layer. IRPS 2022: 61-1 - 2021
- [c1]Patrick Fiorenza, Salvatore Adamo, Mario Santo Alessandrino, Cettina Bottari, Beatrice Carbone, Clarice Di Martino, Alfio Russo, Mario Saggio, Carlo Venuto, Elisa Vitanza, Edoardo Zanetti, Filippo Giannazzo, Fabrizio Roccaforte:
Correlation between MOSFETs breakdown and 4H-SiC epitaxial defects. IRPS 2021: 1-6
2000 – 2009
- 2007
- [j1]Patrick Fiorenza, Raffaella Lo Nigro, Vito Raineri, Salvatore Lombardo
Defects induced anomalous breakdown kinetics in Pr2O3 by micro- and nano-characterization. Microelectron. Reliab. 47(4-5): 640-644 (2007)
Coauthor Index
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