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Meixiong Zhao

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2020 – today

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2020
[j2]
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  - journals/tvlsi/MannZKCPKHVC20
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  - https://dblp.org/rec/journals/tvlsi/MannZKCPKHVC20
Randy W. Mann, Meixiong Zhao, Oh Sung Kwon, Xi Cao, Sanjay Parihar, Muhammed Ahosan Ul Karim, Jack M. Higman, Joseph Versaggi, Rick Carter:
Bias-Dependent Variation in FinFET SRAM. IEEE Trans. Very Large Scale Integr. Syst. 28(5): 1341-1344 (2020)

2010 – 2019

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2019
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Randy W. Mann, Meixiong Zhao, Sanjay Parihar, Qun Gao, Ankur Arya, Carl Radens, Shesh Mani Pandey, Joseph Versaggi, Jack M. Higman, Rick Carter:
An Extrinsic Device and Leakage Mechanism in Advanced Bulk FinFET SRAM. IEEE Trans. Very Large Scale Integr. Syst. 27(8): 1819-1827 (2019)

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