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Uma Sharma
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2020 – today
- 2024
- [j4]Uma Sharma, Mansi Jhamb:
A Novel and Voltage Resilient Design of Ultra-High-Speed Low Power Keeper Based Full Adder. Circuits Syst. Signal Process. 43(12): 7951-7971 (2024) - [c8]Dibyendu Chatterjee, Uma Sharma, Hiroshi Murai, Tomohiko Kudo, Raghu Singanamalla, Haitao Liu:
Body Bias Impact on ION Degradation in SiGe-Channel pMOS without Si-Cap for DRAM Periphery. IRPS 2024: 22 - 2023
- [j3]Uma Sharma, Mansi Jhamb:
Efficient Design of FGMOS-Based Low-Power Low-Voltage XOR Gate. Circuits Syst. Signal Process. 42(5): 2852-2871 (2023) - [c7]Uma Sharma, Preeti Aggarwal, Ajay Mittal:
Recent Trends To Detect Melanoma Using Dermoscopic Images: A Survey. ICCCNT 2023: 1-6 - [c6]Priya Singh, Uma Sharma:
Exploring Low-Power Implementation Techniques for 2:1 MUX Using Conventional and CNTFET Technology: a Performance Comparison. ICCCNT 2023: 1-5 - 2022
- [j2]Uma Sharma, Mansi Jhamb:
A Novel Design of Voltage and Temperature Resilient 9-T Domino Logic XOR /XNOR Cell. Circuits Syst. Signal Process. 41(11): 6314-6332 (2022) - 2021
- [c5]Satyam Kumar, Tarun Samadder, Karansingh Thakor, Uma Sharma, Souvik Mahapatra:
Stochastic and Deterministic Modeling Frameworks for Time Kinetics of Gate Insulator Traps During and After Hot Carrier Stress in MOSFETs. IRPS 2021: 1-5 - 2020
- [c4]Wriddhi Chakraborty, Uma Sharma, Suman Datta, Souvik Mahapatra:
Hot Carrier Degradation in Cryo-CMOS. IRPS 2020: 1-5 - [c3]Nilotpal Choudhury, Uma Sharma, Huimei Zhou, Richard G. Southwick, Miaomiao Wang, Souvik Mahapatra:
Analysis of BTI, SHE Induced BTI and HCD Under Full VG/VD Space in GAA Nano-Sheet N and P FETs. IRPS 2020: 1-6 - [c2]Victor M. van Santen, Simon Thomann, Chaitanya Pasupuleti, Paul R. Genssler, Narendra Gangwar, Uma Sharma, Jörg Henkel, Souvik Mahapatra, Hussam Amrouch:
BTI and HCD Degradation in a Complete 32 × 64 bit SRAM Array - including Sense Amplifiers and Write Drivers - under Processor Activity. IRPS 2020: 1-7
2010 – 2019
- 2019
- [c1]Narendra Parihar, Uma Sharma, Richard G. Southwick, Miaomiao Wang, James H. Stathis, Souvik Mahapatra:
On the Frequency Dependence of Bulk Trap Generation During AC Stress in Si and SiGe RMG P-FinFETs. IRPS 2019: 1-8 - 2017
- [j1]Umesh Kumar, Neha Gopaliya, Uma Sharma, Sandeep Gupta:
Discrete Transform Based Image Fusion: A Review. Int. J. Multim. Data Eng. Manag. 8(2): 43-49 (2017)
Coauthor Index
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last updated on 2024-12-02 22:28 CET by the dblp team
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