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Kazimierz Józwiak

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2010 – 2019

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2012
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Janusz M. Smulko, Kazimierz Józwiak, Marek Olesz:
Quality testing methods of foil-based capacitors. Microelectron. Reliab. 52(3): 603-609 (2012)
2011
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Janusz M. Smulko, Kazimierz Józwiak, Marek Olesz, Lech Hasse:
Acoustic emission for detecting deterioration of capacitors under aging. Microelectron. Reliab. 51(3): 621-627 (2011)

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