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"A Prony-Based Curve-Fitting Method for Characterization of RF Pulses From ..."

Saptarshi Mukherjee et al. (2022)

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DOI: 10.1109/LSP.2021.3135795

access: open

type: Journal Article

metadata version: 2024-03-08

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  - journals/spl/MukherjeeDDLCRV22
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  - https://dblp.org/rec/journals/spl/MukherjeeDDLCRV22
Saptarshi Mukherjee, Karen Dowling, Yicong Dong, Kexin Li, Adam Conway, Shaloo Rakheja, Lars F. Voss:
A Prony-Based Curve-Fitting Method for Characterization of RF Pulses From Optoelectronic Devices. IEEE Signal Process. Lett. 29: 364-368 (2022)

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