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"Using S-parameter measurements to determine the threshold voltage, gain ..."

German A. Alvarez-Botero, Reydezel Torres-Torres, Roberto S. Murphy-Arteaga (2011)

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DOI: 10.1016/J.MICROREL.2010.09.001

access: closed

type: Journal Article

metadata version: 2020-10-26

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German A. Alvarez-Botero, Reydezel Torres-Torres, Roberto S. Murphy-Arteaga:
Using S-parameter measurements to determine the threshold voltage, gain factor, and mobility degradation factor for microwave bulk-MOSFETs. Microelectron. Reliab. 51(2): 342-349 (2011)

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