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"Efficient Built-In Test and Calibration of High Speed Serial I/O Systems ..."

Thomas Moon et al. (2019)

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DOI: 10.1007/S10836-019-05842-8

access: closed

type: Journal Article

metadata version: 2024-10-06

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Thomas Moon, Hyun Woo Choi, David C. Keezer, Abhijit Chatterjee:
Efficient Built-In Test and Calibration of High Speed Serial I/O Systems Using Monobit Signal Acquisition. J. Electron. Test. 35(6): 809-822 (2019)

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