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"Reliability Risks Due to Faults Affecting Selectors of ReRAMs and Possible ..."

Martin Omaña, Sejuti Bardhan, Cecilia Metra (2022)

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DOI: 10.1109/TETC.2021.3114961

access: closed

type: Journal Article

metadata version: 2023-01-15

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  - https://dblp.org/rec/journals/tetc/OmanaBM22
Martin Omaña, Sejuti Bardhan, Cecilia Metra:
Reliability Risks Due to Faults Affecting Selectors of ReRAMs and Possible Solutions. IEEE Trans. Emerg. Top. Comput. 10(4): 2086-2091 (2022)

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