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"Accurate linearity testing with impure sinusoidal stimulus robust against ..."

Yuming Zhuang et al. (2016)

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DOI: 10.1109/VTS.2016.7477296

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
  - conf/vts/ZhuangCCC16
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  persistent URL:
  - https://dblp.org/rec/conf/vts/ZhuangCCC16
Yuming Zhuang, Tao Chen, Shravan K. Chaganti, Degang Chen:
Accurate linearity testing with impure sinusoidal stimulus robust against flicker noise. VTS 2016: 1-6

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