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"Reliability issues in deep deep sub-micron technologies: time-dependent ..."

Antonis Papanikolaou et al. (2007)

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DOI: 10.1109/IOLTS.2007.55

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Antonis Papanikolaou, Hua Wang, Miguel Miranda, Francky Catthoor:
Reliability issues in deep deep sub-micron technologies: time-dependent variability and its impact on embedded system design. IOLTS 2007: 121

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